GitLab

* File renaming and class renaming for device element-wise operation

* Add batchnorm-infer instances, external API and client example

* Add batchnorm-infer profiler module and gtests

* Remove file device_elementwise_extension.hpp and move NormalizeInInfer operation to element_wise_operation.hpp

* Remove the using of class aliasing for DeviceElementwiseForBatchNormInfer

* Rename class and file due to conflict from device_elementwise_2d.hpp

* Fix namespace in batcnnorm_infer_nhwc client example

* Refine the device batchnorm-backward base API templates and data type assignments

* Remove duplicated kernel file

* Add batchnorm backward instances and external API

* Add batchnorm-backward profiler and tests

* Add client example which uses batchnorm backward external API

* Merge test/batchnorm_fwd and test/batchnorm_bwd into one directory

* Loose the threshold for batchnorm-backward check_err()

* Update to device_batchnorm_forward base class to include all template parameters for problem description

* Add batchnorm forward instances and external api

* Add batchnorm forward profiler module which uses the external api

* Add some comments in batchnorm_forward example to explain the dimensions in lengths[]

* Replace the reference_batchnorm_forward_nhwc_c by generic reference_batchnorm_forward

* Improvement to the batchnorm infer base API

* Add batchnorm forward client example which shows using the batchnorm forward external API

* Add test for batchnorm forward

* Tuning the batchnorm profiler initialized values and error threshold

* Add support for bhalf_t in instances/external api/tests

* Add support for int8_t in instances/external api/tests

* Add support for double in instances/external api/tests

* Let ScaleDataType and BiasDataType be same as XDataType and YDataType when creating instances

* Checking before running best instance in batchnorm_fwd_nhwc client example

* Add checking for YElementwiseOp in batchnorm_forward external API

* Add more types in batchnorm forward profiler

* Add more test lengths
Co-authored-by: rocking5566 <ChunYu.Lai@amd.com>